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Information card for entry 1552210
Preview
| Coordinates | 1552210.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C47 H78 Al N4 P Ru |
|---|---|
| Calculated formula | C47 H78 Al N4 P Ru |
| SMILES | [RuH2]1([H][Al]2([H]1)N(C(=CC(=[N]2c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C)([P](C1CCCCC1)(C1CCCCC1)C1CCCCC1)[N]#N |
| Title of publication | The Partial Dehydrogenation of Aluminium Dihydrides |
| Authors of publication | Hooper, Thomas; Lau, Samantha; Chen, Wenyi; Brown, Ryan; Garçon, Martí; Luong, Karen; Barrow, Nathan; Tatton, Andrew; Sackman, George A.; Richardson, Christopher; White, Andrew J. P.; Cooper, Richard Ian; Edwards, Alison; Casely, Ian; Crimmin, Mark Richard |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 10.7298 ± 0.0005 Å |
| b | 11.865 ± 0.0005 Å |
| c | 19.6541 ± 0.0007 Å |
| α | 83.163 ± 0.003° |
| β | 86.568 ± 0.003° |
| γ | 70.525 ± 0.004° |
| Cell volume | 2341.67 ± 0.18 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0551 |
| Residual factor for significantly intense reflections | 0.0445 |
| Weighted residual factors for significantly intense reflections | 0.105 |
| Weighted residual factors for all reflections included in the refinement | 0.1116 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.057 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 217515 (current) | 2019-08-14 | cif/ Adding structures of 1552210, 1552211, 1552212, 1552213, 1552214 via cif-deposit CGI script. |
1552210.cif |
All data in the COD and the database itself are dedicated to the
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.
Users of the data should acknowledge the original authors of the
structural data.