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Information card for entry 1556555
Preview
Coordinates | 1556555.cif |
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Original paper (by DOI) | HTML |
Formula | C51 H100 N6 Pd4 Si3 |
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Calculated formula | C51 H100 N6 Pd4 Si3 |
SMILES | [Pd]12([Pd]3456[Pd]([Si]14(C(C)C)C(C)C)([Si]5([Pd]3([Si]26(C(C)C)C(C)C)=C1N(C(=C(N1C(C)C)C)C)C(C)C)(C(C)C)C(C)C)=C1N(C(=C(N1C(C)C)C)C)C(C)C)=C1N(C(=C(N1C(C)C)C)C)C(C)C |
Title of publication | Construction of a Planar Tetrapalladium Cluster by the Reaction of Palladium(0) Bis(isocyanide) with Cyclic Tetrasilane |
Authors of publication | Sunada, Y.; Taniyama, N.; Shimamoto, K.; Kyushin, S.; Nagashima, H. |
Journal of publication | Inorganics |
Year of publication | 2017 |
Journal volume | 5 |
Pages of publication | 84 |
a | 14.505 ± 0.003 Å |
b | 15.339 ± 0.004 Å |
c | 15.655 ± 0.004 Å |
α | 89.593 ± 0.012° |
β | 63.724 ± 0.006° |
γ | 81.301 ± 0.011° |
Cell volume | 3080.2 ± 1.3 Å3 |
Cell temperature | 193 K |
Ambient diffraction temperature | 193 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0585 |
Residual factor for significantly intense reflections | 0.0439 |
Weighted residual factors for significantly intense reflections | 0.0933 |
Weighted residual factors for all reflections included in the refinement | 0.1016 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
245052 (current) | 2019-12-13 | cif/ Adding structures of 1556554, 1556555, 1556556 via cif-deposit CGI script. |
1556555.cif |
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Users of the data should acknowledge the original authors of the
structural data.