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Information card for entry 1557420
Preview
| Coordinates | 1557420.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Bu4N[Pt(ppy)Cl2] |
|---|---|
| Formula | C27 H44 Cl2 N2 Pt |
| Calculated formula | C27 Cl2 N2 Pt |
| SMILES | [Pt]1(c2c(c3[n]1cccc3)cccc2)(Cl)Cl.[N+](CCCC)(CCCC)(CCCC)CCCC |
| Title of publication | Crystal Structures of Bu4N[Pt(ppy)Cl2], Et4N[Pt(tpy)Cl2] and [Pt(ppy)en]Cl (ppy = N,C'-Chelated 2-Phenylpyridinate, tpy = N,C'-Chelated 2-(2'-Thienyl)pyridinate, en = N,N'-Chelated 1,2-Diaminoethane). |
| Authors of publication | Kvam, Per-Inge; Engebretsen, Thoralf; Maartmann-Moe, Knut; Songstad, Jon |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1996 |
| Journal volume | 50 |
| Pages of publication | 107 - 113 |
| a | 11.551 ± 0.002 Å |
| b | 16.759 ± 0.005 Å |
| c | 14.541 ± 0.009 Å |
| α | 90° |
| β | 98.68 ± 0.03° |
| γ | 90° |
| Cell volume | 2783 ± 2 Å3 |
| Ambient diffraction temperature | 93 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for significantly intense reflections | 0.038 |
| Weighted residual factors for significantly intense reflections | 0.031 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.405 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 248585 (current) | 2020-03-02 | cif/ Adding structures of 1557420 via cif-deposit CGI script. |
1557420.cif |
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Users of the data should acknowledge the original authors of the
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