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Information card for entry 1559211
Preview
Coordinates | 1559211.cif |
---|---|
Structure factors | 1559211.hkl |
Original IUCr paper | HTML |
Chemical name | 2,2-Bis[3,5-bis(dimethylamino)phenyl]-1,1,1,3,3,3-hexamethyltrisilane |
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Formula | C26 H48 N4 Si3 |
Calculated formula | C26 H48 N4 Si3 |
SMILES | [Si]([Si]([Si](C)(C)C)(c1cc(cc(c1)N(C)C)N(C)C)c1cc(cc(c1)N(C)C)N(C)C)(C)(C)C |
Title of publication | 2,2-Bis[3,5-bis(dimethylamino)phenyl]-1,1,1,3,3,3-hexamethyltrisilane |
Authors of publication | Mizuhata, Yoshiyuki; Iwai, Kento; Tokitoh, Norihiro |
Journal of publication | IUCrData |
Year of publication | 2020 |
Journal volume | 5 |
Journal issue | 9 |
Pages of publication | x201299 |
a | 20.6543 ± 0.0003 Å |
b | 8.365 ± 0.0001 Å |
c | 17.5215 ± 0.0003 Å |
α | 90° |
β | 97.371 ± 0.002° |
γ | 90° |
Cell volume | 3002.23 ± 0.08 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0397 |
Residual factor for significantly intense reflections | 0.0325 |
Weighted residual factors for significantly intense reflections | 0.0817 |
Weighted residual factors for all reflections included in the refinement | 0.0863 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
256801 (current) | 2020-09-26 | cif/ hkl/ Adding structures of 1559211 via cif-deposit CGI script. |
1559211.cif 1559211.hkl |
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Users of the data should acknowledge the original authors of the
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