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Information card for entry 1565032
Preview
| Coordinates | 1565032.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H47 Cd Cl2 N5 O8 |
|---|---|
| Calculated formula | C38 H47 Cd Cl2 N5 O8 |
| Title of publication | Exciplex formation as an approach to selective Copper(II) fluorescent sensors |
| Authors of publication | Correia, Bruna B.; Brown, Thomas R.; Reibenspies, Joseph H.; Lee, Hee-Seung; Hancock, Robert D. |
| Journal of publication | Inorganica Chimica Acta |
| Year of publication | 2020 |
| Journal volume | 506 |
| Pages of publication | 119544 |
| a | 12.8274 ± 0.0003 Å |
| b | 13.1823 ± 0.0003 Å |
| c | 23.1202 ± 0.0005 Å |
| α | 90° |
| β | 101.326 ± 0.001° |
| γ | 90° |
| Cell volume | 3833.37 ± 0.15 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 99.99 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0474 |
| Residual factor for significantly intense reflections | 0.0435 |
| Weighted residual factors for significantly intense reflections | 0.1117 |
| Weighted residual factors for all reflections included in the refinement | 0.1142 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.095 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 270055 (current) | 2021-10-21 | cif/ Adding structures of 1565031, 1565032, 1565033, 1565034 via cif-deposit CGI script. |
1565032.cif |
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Users of the data should acknowledge the original authors of the
structural data.