Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1565034
Preview
Coordinates | 1565034.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H44 Cl2 N4 O8 Pb |
---|---|
Calculated formula | C36 H44 Cl2 N4 O8 Pb |
SMILES | [Pb]123[N]4(CC[N]3(CC[N]2(CC[N]1(CC4)Cc1ccccc1)Cc1ccccc1)Cc1ccccc1)Cc1ccccc1.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
Title of publication | Exciplex formation as an approach to selective Copper(II) fluorescent sensors |
Authors of publication | Correia, Bruna B.; Brown, Thomas R.; Reibenspies, Joseph H.; Lee, Hee-Seung; Hancock, Robert D. |
Journal of publication | Inorganica Chimica Acta |
Year of publication | 2020 |
Journal volume | 506 |
Pages of publication | 119544 |
a | 10.1622 ± 0.0004 Å |
b | 18.9273 ± 0.0007 Å |
c | 19.6809 ± 0.0007 Å |
α | 90° |
β | 91.106 ± 0.002° |
γ | 90° |
Cell volume | 3784.8 ± 0.2 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0597 |
Residual factor for significantly intense reflections | 0.0465 |
Weighted residual factors for significantly intense reflections | 0.0957 |
Weighted residual factors for all reflections included in the refinement | 0.1013 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
270055 (current) | 2021-10-21 | cif/ Adding structures of 1565031, 1565032, 1565033, 1565034 via cif-deposit CGI script. |
1565034.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.