Crystallography Open Database

Information card for entry 1566944

Preview

Coordinates	1566944.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C93 H170 O4 Si2 Tm2
Calculated formula	C78 H134 O4 Si2 Tm2
SMILES	[Tm]123456789(OC%10C(OC([Si](C)(C)C)([Si](C)(C)C)C=%10O1)=[O][Tm]1%10%11%12%13%14%15%16([c]%17([c]1([cH]%10[c]%11([cH]%12%17)C(C)(C)C)C(C)(C)C)C(C)(C)C)[c]1([c]%13([cH]%14[c]%15([cH]%161)C(C)(C)C)C(C)(C)C)C(C)(C)C)([cH]1[c]2([c]3([cH]4[c]51C(C)(C)C)C(C)(C)C)C(C)(C)C)[c]1([cH]9[c]8([cH]7[c]61C(C)(C)C)C(C)(C)C)C(C)(C)C
Title of publication	CO reductive oligomerization by a divalent thulium complex and CO2-induced functionalization
Authors of publication	Simler, Thomas; McCabe, Karl Nael; Maron, Laurent; Nocton, Grégory
Journal of publication	Chemical Science
Year of publication	2022
a	13.4591 ± 0.0011 Å
b	17.361 ± 0.0014 Å
c	20.0159 ± 0.0014 Å
α	65.739 ± 0.002°
β	85.671 ± 0.003°
γ	77.074 ± 0.003°
Cell volume	4155.2 ± 0.6 Å³
Cell temperature	150 K
Ambient diffraction temperature	150 K
Number of distinct elements	5
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0375
Residual factor for significantly intense reflections	0.0249
Weighted residual factors for significantly intense reflections	0.0591
Weighted residual factors for all reflections included in the refinement	0.0654
Goodness-of-fit parameter for all reflections included in the refinement	1.044
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
275283 (current)	2022-05-10	cif/ Adding structures of 1566938, 1566939, 1566940, 1566941, 1566942, 1566943, 1566944, 1566945, 1566946 via cif-deposit CGI script.	1566944.cif