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Information card for entry 1566967
Preview
| Coordinates | 1566967.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H54 N5 O5 Ta |
|---|---|
| Calculated formula | C38 H54 N5 O5 Ta |
| SMILES | [Ta]123(ON(c4c(CN(Cc5ccccc5N(O1)C(C)(C)C)Cc1ccccc1N(O2)C(C)(C)C)cccc4)C(C)(C)C)OC(=O)N3C(C)(C)C |
| Title of publication | Tantalum, Easy as Pi: Understanding Differences in Metal-Imido Bonding Towards Improving Ta/Nb Separations |
| Authors of publication | Weberg, Alexander B.; Schelter, Eric J.; Carroll, Patrick; Gau, Michael; Pandey, Pragati; Lapsheva, Ekaterina; Schatz, George C.; Cheisson, Thibault; Chaudhuri, Subhajyoti; Uruburo, Christian |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| a | 10.8852 ± 0.0004 Å |
| b | 15.2484 ± 0.0004 Å |
| c | 12.4719 ± 0.0005 Å |
| α | 90° |
| β | 114.466 ± 0.005° |
| γ | 90° |
| Cell volume | 1884.23 ± 0.14 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.044 |
| Residual factor for significantly intense reflections | 0.0313 |
| Weighted residual factors for significantly intense reflections | 0.0556 |
| Weighted residual factors for all reflections included in the refinement | 0.0582 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 275380 (current) | 2022-05-13 | cif/ Adding structures of 1566965, 1566966, 1566967 via cif-deposit CGI script. |
1566967.cif |
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Users of the data should acknowledge the original authors of the
structural data.