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Information card for entry 1572886
Preview
| Coordinates | 1572886.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C68 H82 N2 O6 Si6 |
|---|---|
| Calculated formula | C68 H82 N2 O6 Si6 |
| Title of publication | Engineering Circularly Polarized Light Emission in Nanostructured Oligodimethylsiloxane-Helicene Chiral Materials |
| Authors of publication | Cadeddu, Stefano; van den Bersselaar, Bart; de Waal, Bas FM; Cordier, Marie; Vanthuyne, Nicolas; Meskers, Stefan C. J.; Vantomme, Ghislaine; Crassous, Jeanne |
| Journal of publication | Nanoscale |
| Year of publication | 2024 |
| a | 38.942 ± 0.007 Å |
| b | 9.594 ± 0.0016 Å |
| c | 19.295 ± 0.002 Å |
| α | 90° |
| β | 102.551 ± 0.006° |
| γ | 90° |
| Cell volume | 7036.5 ± 1.9 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0687 |
| Residual factor for significantly intense reflections | 0.0509 |
| Weighted residual factors for significantly intense reflections | 0.1249 |
| Weighted residual factors for all reflections included in the refinement | 0.1352 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 295545 (current) | 2024-10-19 | cif/ Adding structures of 1572885, 1572886 via cif-deposit CGI script. |
1572886.cif |
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Users of the data should acknowledge the original authors of the
structural data.