Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1575550
Preview
| Coordinates | 1575550.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H10 N2 O |
|---|---|
| Calculated formula | C16 H10 N2 O |
| Title of publication | Overcoming ACQ: DPA-Modified TICT-Type AIEgens for High-Resolution and Multilevel Latent Fingerprint Visualization |
| Authors of publication | Fan, Liangxin; Zhu, Xinxin; Wu, Wanjin; Wang, Xingxiao; Zhang, Sheng; Wan, Jingwei; Jiang, Song; Lin, Lu; Gao, Haoyu; Wang, Jinjin; Cao, Zhan-Qi; Pan, Zhenliang; Xu, Zhi-Hong; Liu, Lijie |
| Journal of publication | Materials Horizons |
| Year of publication | 2025 |
| a | 4.1747 ± 0.0006 Å |
| b | 22.829 ± 0.0017 Å |
| c | 12.14 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1157 ± 0.2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P b c 21 |
| Hall space group symbol | P 2c -2b |
| Residual factor for all reflections | 0.0473 |
| Residual factor for significantly intense reflections | 0.0413 |
| Weighted residual factors for significantly intense reflections | 0.1102 |
| Weighted residual factors for all reflections included in the refinement | 0.1176 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 301921 (current) | 2025-08-28 | cif/ Adding structures of 1575549, 1575550, 1575551 via cif-deposit CGI script. |
1575550.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.