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Information card for entry 2243943
Preview
Coordinates | 2243943.cif |
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Structure factors | 2243943.hkl |
Original IUCr paper | HTML |
Chemical name | Bis[(ethoxymethanethioyl)sulfanido](<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-\ tetramethylethane-1,2-diamine)mercury(II) |
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Formula | C12 H26 Hg N2 O2 S4 |
Calculated formula | C12 H26 Hg N2 O2 S4 |
SMILES | C(=S)(OCC)S[Hg]1([N](CC[N]1(C)C)(C)C)SC(=S)OCC |
Title of publication | Crystal structure and Hirshfeld surface analysis of bis[(ethoxymethanethioyl)sulfanido](<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethane-1,2-diamine)mercury(II) |
Authors of publication | Qadir, Adnan M.; Kansiz, Sevgi; Dege, Necmi; Saif, Eiad |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2021 |
Journal volume | 77 |
Journal issue | 11 |
a | 12.235 ± 0.007 Å |
b | 8.017 ± 0.005 Å |
c | 21.251 ± 0.017 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2084 ± 2 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.086 |
Residual factor for significantly intense reflections | 0.0526 |
Weighted residual factors for significantly intense reflections | 0.1295 |
Weighted residual factors for all reflections included in the refinement | 0.1473 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.997 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
270048 (current) | 2021-10-20 | cif/ hkl/ Adding structures of 2243943 via cif-deposit CGI script. |
2243943.cif 2243943.hkl |
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Users of the data should acknowledge the original authors of the
structural data.