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Information card for entry 2243950
Preview
| Coordinates | 2243950.cif |
|---|---|
| Structure factors | 2243950.hkl |
| Original IUCr paper | HTML |
| Common name | <i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-Tetramethylethanediamine |
|---|---|
| Chemical name | <i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-Tetramethylethane-1,2-diamine |
| Formula | C6 H16 N2 |
| Calculated formula | C6 H16 N2 |
| SMILES | CN(C)CCN(C)C |
| Title of publication | Crystal structure of <i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethanediamine |
| Authors of publication | Schrimpf, Tobias; Otte, Felix; Strohmann, Carsten |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2022 |
| Journal volume | 78 |
| Journal issue | 1 |
| a | 5.6987 ± 0.0013 Å |
| b | 8.311 ± 0.002 Å |
| c | 8.453 ± 0.002 Å |
| α | 90° |
| β | 106.954 ± 0.009° |
| γ | 90° |
| Cell volume | 382.95 ± 0.16 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0482 |
| Residual factor for significantly intense reflections | 0.038 |
| Weighted residual factors for significantly intense reflections | 0.103 |
| Weighted residual factors for all reflections included in the refinement | 0.1097 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 271439 (current) | 2021-12-15 | cif/ hkl/ Adding structures of 2243950 via cif-deposit CGI script. |
2243950.cif 2243950.hkl |
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Users of the data should acknowledge the original authors of the
structural data.