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Information card for entry 4515781
Preview
Coordinates | 4515781.cif |
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Original paper (by DOI) | HTML |
Formula | C26 H20 Cl8 F6 N2 W2 |
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Calculated formula | C26 H20 Cl8 F6 N2 W2 |
SMILES | N(=[W]1(Cl)(Cl)(Cl)[Cl][W](=Nc2c(cc(cc2F)F)F)(Cl)(Cl)(Cl)[Cl]1)c1c(cc(cc1F)F)F.Cc1ccccc1.Cc1ccccc1 |
Title of publication | Exploration of Homogeneous Ethylene Dimerization Mediated by Tungsten Mono(imido) Complexes |
Authors of publication | Messinis, Antonis M.; Wright, William R. H.; Batsanov, Andrei S.; Howard, Judith A. K.; Hanton, Martin J.; Dyer, Philip W. |
Journal of publication | ACS Catalysis |
Year of publication | 2018 |
Journal volume | 8 |
Journal issue | 12 |
Pages of publication | 11235 |
a | 7.1984 ± 0.0005 Å |
b | 9.6255 ± 0.0006 Å |
c | 12.8058 ± 0.0008 Å |
α | 68.524 ± 0.016° |
β | 86.291 ± 0.018° |
γ | 81.137 ± 0.018° |
Cell volume | 815.79 ± 0.13 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0286 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for significantly intense reflections | 0.0559 |
Weighted residual factors for all reflections included in the refinement | 0.058 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
225905 (current) | 2019-11-10 | cif/ Adding structures of 4515780, 4515781, 4515782, 4515783, 4515784, 4515785, 4515786, 4515787, 4515788, 4515789 via cif-deposit CGI script. |
4515781.cif |
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Users of the data should acknowledge the original authors of the
structural data.