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Information card for entry 7233516
Preview
| Coordinates | 7233516.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H20 Cl2 S4 |
|---|---|
| Calculated formula | C34 H20 Cl2 S4 |
| SMILES | Clc1ccc(C2=c3sc(=CC=c4sc(cc4)=C(c4sc(C=Cc5sc2cc5)cc4)c2ccc(Cl)cc2)cc3)cc1 |
| Title of publication | Substitution effects on the electrical tranporting properties of tetrathia[22]annulene[2,1,2,1]: experimental and theoretical investigations |
| Authors of publication | Jing Zhang; Zhiying Ma; Qian Zhang; Tarunpreet Singh Virk; Hua Geng; Dong Wang; Wei Xu; Zhigang Shuai; Kamaljit Singh; Wenping Hu; Daoben Zhu |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2013 |
| Journal volume | 1 |
| Pages of publication | 5765 - 5771 |
| a | 11.102 ± 0.003 Å |
| b | 11.949 ± 0.003 Å |
| c | 12.195 ± 0.003 Å |
| α | 108.95 ± 0.002° |
| β | 112.42 ± 0.002° |
| γ | 95.82 ± 0.002° |
| Cell volume | 1366.7 ± 0.6 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0525 |
| Residual factor for significantly intense reflections | 0.0455 |
| Weighted residual factors for significantly intense reflections | 0.1041 |
| Weighted residual factors for all reflections included in the refinement | 0.1078 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.117 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 217786 (current) | 2019-08-28 | cif/ Adding structures of 7233516 via cif-deposit CGI script. |
7233516.cif |
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Users of the data should acknowledge the original authors of the
structural data.