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Information card for entry 7234487
Preview
| Coordinates | 7234487.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H16 S3 |
|---|---|
| Calculated formula | C23.996 H10 S2.996 |
| Title of publication | Isomers of organic semiconductors based on dithienothiophenes: the effect of sulphur atoms positions on the intermolecular interactions and field-effect performances |
| Authors of publication | Wenjing Yi; Shuai Zhao; Huiliang Sun; Yuhe Kan; Jianwu Shi; Shisheng Wan; Chunli Li; Hua Wang |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2015 |
| Journal volume | 3 |
| Pages of publication | 10856 - 10861 |
| a | 7.4707 ± 0.0012 Å |
| b | 5.9227 ± 0.001 Å |
| c | 42.784 ± 0.007 Å |
| α | 90° |
| β | 92.76 ± 0.003° |
| γ | 90° |
| Cell volume | 1890.9 ± 0.5 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1263 |
| Residual factor for significantly intense reflections | 0.0742 |
| Weighted residual factors for significantly intense reflections | 0.2073 |
| Weighted residual factors for all reflections included in the refinement | 0.2533 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 219193 (current) | 2019-10-09 | cif/ Adding structures of 7234487 via cif-deposit CGI script. |
7234487.cif |
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Users of the data should acknowledge the original authors of the
structural data.