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Information card for entry 7234503
Preview
| Coordinates | 7234503.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H54 N2 O2 S2 |
|---|---|
| Calculated formula | C38 H54 N2 O2 S2 |
| Title of publication | Enhanced electron mobility in crystalline thionated naphthalene diimides |
| Authors of publication | Lisa M. Kozycz; Chang Guo; Joseph G. Manion; Andrew J. Tilley; Alan J. Lough; Yuning Li; Dwight S. Seferos |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2015 |
| Journal volume | 3 |
| Pages of publication | 11505 - 11515 |
| a | 4.6497 ± 0.0002 Å |
| b | 6.8344 ± 0.0003 Å |
| c | 27.9597 ± 0.0012 Å |
| α | 87.196 ± 0.002° |
| β | 85.342 ± 0.002° |
| γ | 74.748 ± 0.002° |
| Cell volume | 854.02 ± 0.06 Å3 |
| Cell temperature | 147 ± 2 K |
| Ambient diffraction temperature | 147 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0547 |
| Residual factor for significantly intense reflections | 0.0443 |
| Weighted residual factors for significantly intense reflections | 0.1168 |
| Weighted residual factors for all reflections included in the refinement | 0.1222 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 219201 (current) | 2019-10-09 | cif/ Adding structures of 7234503, 7234504, 7234505, 7234506 via cif-deposit CGI script. |
7234503.cif |
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Users of the data should acknowledge the original authors of the
structural data.