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Information card for entry 7234506
Preview
| Coordinates | 7234506.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H54 N2 O2 S2 |
|---|---|
| Calculated formula | C38 H54 N2 O2 S2 |
| Title of publication | Enhanced electron mobility in crystalline thionated naphthalene diimides |
| Authors of publication | Lisa M. Kozycz; Chang Guo; Joseph G. Manion; Andrew J. Tilley; Alan J. Lough; Yuning Li; Dwight S. Seferos |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2015 |
| Journal volume | 3 |
| Pages of publication | 11505 - 11515 |
| a | 4.642 ± 0.0002 Å |
| b | 46.2015 ± 0.0016 Å |
| c | 7.8037 ± 0.0003 Å |
| α | 90° |
| β | 96.678 ± 0.003° |
| γ | 90° |
| Cell volume | 1662.28 ± 0.11 Å3 |
| Cell temperature | 147 ± 2 K |
| Ambient diffraction temperature | 147 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0589 |
| Residual factor for significantly intense reflections | 0.0464 |
| Weighted residual factors for significantly intense reflections | 0.1113 |
| Weighted residual factors for all reflections included in the refinement | 0.1188 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 219201 (current) | 2019-10-09 | cif/ Adding structures of 7234503, 7234504, 7234505, 7234506 via cif-deposit CGI script. |
7234506.cif |
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Users of the data should acknowledge the original authors of the
structural data.