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Information card for entry 7250510
Preview
| Coordinates | 7250510.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Bis[(E)-2-(((2-benzoyl-4-chlorophenyl)imino)methyl)phenolato-κ^2^N,O]copper(II) |
|---|---|
| Formula | C40 H26 Cl2 Cu N2 O4 |
| Calculated formula | C40 H26 Cl2 Cu N2 O4 |
| Title of publication | Square planar vs. pyramidal copper(ii)-complexes with benzylal vs. naphthylal-based Schiff bases |
| Authors of publication | Enamullah, Mohammed; Haque, Imdadul; Resma, Amina Khan; Abdullah, Galib; Uddin, Md. Najem; Haj Hassani Sohi, Takin; Woschko, Dennis; Ferber, Peter; Janiak, Christoph |
| Journal of publication | RSC Advances |
| Year of publication | 2025 |
| Journal volume | 15 |
| Journal issue | 23 |
| Pages of publication | 18358 - 18371 |
| a | 19.4435 ± 0.0003 Å |
| b | 8.5568 ± 0.0002 Å |
| c | 19.5887 ± 0.0004 Å |
| α | 90° |
| β | 95.049 ± 0.002° |
| γ | 90° |
| Cell volume | 3246.41 ± 0.11 Å3 |
| Cell temperature | 99.99 ± 0.1 K |
| Ambient diffraction temperature | 99.99 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0518 |
| Residual factor for significantly intense reflections | 0.0441 |
| Weighted residual factors for significantly intense reflections | 0.1069 |
| Weighted residual factors for all reflections included in the refinement | 0.1104 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 299991 (current) | 2025-06-06 | cif/ Adding structures of 7250509, 7250510, 7250511, 7250512, 7250513, 7250514 via cif-deposit CGI script. |
7250510.cif |
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Users of the data should acknowledge the original authors of the
structural data.