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Information card for entry 1556427
Preview
| Coordinates | 1556427.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H58 P2 Si2 U |
|---|---|
| Calculated formula | C38 H58 P2 Si2 U |
| SMILES | [c]12([c]3([c]4([c]5([c]1(C)[U]23451678(P([Si](C)(C)C)c2ccccc2)([c]2([c]1([c]6([c]7([c]28C)C)C)C)C)P(c1ccccc1)[Si](C)(C)C)C)C)C)C |
| Title of publication | Thorium(IV) and Uranium(IV) Phosphaazaallenes |
| Authors of publication | Rungthanaphatsophon, P.; Fajen, O.J.; Kelley, S.P.; Walensky, J.R. |
| Journal of publication | Inorganics |
| Year of publication | 2019 |
| Journal volume | 7 |
| Pages of publication | 105 |
| a | 12.0767 ± 0.0011 Å |
| b | 12.0767 ± 0.0011 Å |
| c | 26.931 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3927.8 ± 0.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 96 |
| Hermann-Mauguin space group symbol | P 43 21 2 |
| Hall space group symbol | P 4nw 2abw |
| Residual factor for all reflections | 0.0212 |
| Residual factor for significantly intense reflections | 0.0166 |
| Weighted residual factors for significantly intense reflections | 0.032 |
| Weighted residual factors for all reflections included in the refinement | 0.033 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.983 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 244924 (current) | 2019-12-06 | cif/ Adding structures of 1556427 via cif-deposit CGI script. |
1556427.cif |
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Users of the data should acknowledge the original authors of the
structural data.