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Information card for entry 1565016
Preview
| Coordinates | 1565016.cif | 
|---|---|
| Original paper (by DOI) | HTML | 
| Formula | C67 H95 B3 N4 Si2 | 
|---|---|
| Calculated formula | C67 H95 B3 N4 Si2 | 
| SMILES | [Si]1(=[Si](B1c1c(cc(cc1C(C)C)C(C)C)C(C)C)B1N(c2c(cccc2C(C)C)C(C)C)C=CN1c1c(C(C)C)cccc1C(C)C)B1N(c2c(cccc2C(C)C)C(C)C)C=CN1c1c(C(C)C)cccc1C(C)C | 
| Title of publication | Isolation of a Planar 1,2-Dilithio-disilene and Its Conversion to Si−B Hybrid 2π-Electron System and a Planar Tetraboryldisilene | 
| Authors of publication | Tian, Miao; Zhang, Jianying; Guo, Lulu; Cui, Chunming | 
| Journal of publication | Chemical Science | 
| Year of publication | 2021 | 
| a | 14.0914 ± 0.0005 Å | 
| b | 24.4943 ± 0.0007 Å | 
| c | 20.4237 ± 0.0007 Å | 
| α | 90° | 
| β | 90.338 ± 0.003° | 
| γ | 90° | 
| Cell volume | 7049.3 ± 0.4 Å3 | 
| Cell temperature | 113.15 K | 
| Ambient diffraction temperature | 113.15 K | 
| Number of distinct elements | 5 | 
| Space group number | 14 | 
| Hermann-Mauguin space group symbol | P 1 21/n 1 | 
| Hall space group symbol | -P 2yn | 
| Residual factor for all reflections | 0.1276 | 
| Residual factor for significantly intense reflections | 0.0672 | 
| Weighted residual factors for significantly intense reflections | 0.1511 | 
| Weighted residual factors for all reflections included in the refinement | 0.178 | 
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 | 
| Diffraction radiation wavelength | 0.71073 Å | 
| Diffraction radiation type | MoKα | 
| Has coordinates | Yes | 
| Has disorder | No | 
| Has Fobs | No | 
| Revision | Date | Message | Files | 
|---|---|---|---|
| 270032 (current) | 2021-10-20 | cif/ Adding structures of 1565015, 1565016, 1565017, 1565018, 1565019 via cif-deposit CGI script.  | 
	1565016.cif | 
          All data in the COD and the database itself are dedicated to the
          public domain and licensed under the
          
    CC0
    License
.
          Users of the data should acknowledge the original authors of the
          structural data.